Magnetic-field measurements of current-carrying devices by force-sensitive magnetic-force microscopy with potential correction

Applied Physics Letters

Volumn 78, Issue 7, 2001, Pages 1005-1007

  Alvarez, Tony ^a   Kalinin, Sergei V ^a   Bonnell, Dawn A ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012304838     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1345818     Document Type: Article

References (22)

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