Atomic force microscopy characterization of Zerodur mirror substrates for the extreme ultraviolet telescopes aboard NASA's solar dynamics observatory

Applied Optics

Volumn 46, Issue 16, 2007, Pages 3156-3163

  Soufli, Regina ^a   Baker, Sherry L ^a   Windt, David L ^b   Gullikson, Eric M ^c   Robinson, Jeff C ^a   Podgorski, William A ^d   Golub, Leon ^d  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b Reflective X ray Optics LLC   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; NASA; SURFACE ROUGHNESS; TELESCOPES; TOPOGRAPHY; ULTRAVIOLET DETECTORS;

MIRROR SUBSTRATES; MULTILAYER COATINGS; POLISHING VENDORS; PRECISION METROLOGY;

MIRRORS;

EID: 34547377236     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.003156     Document Type: Article

References (15)

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