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Volumn 19, Issue 13, 2007, Pages 3139-3143

New chemical method of obtaining thick Ga1-xMnxN layers: Prospective spintronic material

(12) Kaminski, Michal a Podsiadlo, Slawomir a Dominik, Pawel a Wozniak, Krzysztof b Dobrzycki, Lukasz b Jakiela, Rafal c Barcz, Adam c,d Psoda, Marek a Mizera, Jaroslaw a Bacewicz, Rajmund a Zajac, Marcin b Twardowski, Andrzej b

a WARSAW UNIVERSITY OF TECHNOLOGY (Poland)

b UNIVERSITY OF WARSAW (Poland)

c INSTITUTE OF PHYSICS (Poland)

d POLISH ACADEMY OF SCIENCES (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIA; CRYSTALLINE MATERIALS; GALLIUM NITRIDE; GROWTH RATE; MANGANESE COMPOUNDS; X RAY DIFFRACTION;

CRYSTALLINE QUALITY; SPINTRONIC MATERIALS; STRUCTURE REFINEMENT; SUBLIMATION SANDWICH METHOD (SSM);

MAGNETOELECTRONICS;

EID: 34547364525 PISSN: 08974756 EISSN: None Source Type: Journal
DOI: 10.1021/cm062459j Document Type: Article

Times cited : (13)

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