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Volumn 18, Issue 32, 2007, Pages
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Charging dynamics and strong localization of a two-dimensional electron cloud
b
CEA GRENOBLE
(France)
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE INJECTION;
COULOMB BLOCKADE;
ELECTRIC FIELD EFFECTS;
ELECTRIC POTENTIAL;
ELECTROSTATIC FORCE;
SILICON;
CHARGE RETENTION;
CHARGING DYNAMICS;
ELECTRON CLOUDS;
NANOCRYSTALS;
NANOCRYSTAL;
SILICON;
ARTICLE;
DENSITY;
DYNAMICS;
ELECTRIC FIELD;
ELECTRICITY;
ELECTRON;
EXPERIMENTAL STUDY;
FIELD EMISSION;
PRIORITY JOURNAL;
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EID: 34547099313
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/18/32/325403 Document Type: Article |
Times cited : (3)
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References (19)
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