Charging dynamics and strong localization of a two-dimensional electron cloud

Nanotechnology

Volumn 18, Issue 32, 2007, Pages

  Dianoux, R ^a,b   Smilde, H J H ^c   Marchi, F ^a,d,e   Buffet, N ^c   Mur, P ^c   Comin, F ^a   Chevrier, J ^a,d,e  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b CEA GRENOBLE   (France)

^c CEA LETI   (France)

^d LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^e UNIV GRENOBLE ALPES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE INJECTION; COULOMB BLOCKADE; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; ELECTROSTATIC FORCE; SILICON;

CHARGE RETENTION; CHARGING DYNAMICS; ELECTRON CLOUDS;

NANOCRYSTALS;

NANOCRYSTAL; SILICON;

ARTICLE; DENSITY; DYNAMICS; ELECTRIC FIELD; ELECTRICITY; ELECTRON; EXPERIMENTAL STUDY; FIELD EMISSION; PRIORITY JOURNAL;

EID: 34547099313     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/32/325403     Document Type: Article

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