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Volumn 58, Issue 23, 1998, Pages 15632-15635

Defect studies in as-deposited and processed nanocrystalline structures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000075376     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.15632     Document Type: Article
Times cited : (56)

References (28)
  • 11
    • 85037907875 scopus 로고
    • Light Emission from Silicon, edited by S. S. Iyer, R. T. Collins, and L. T. Canham, Materials Research Society Symposia Proceedings No. 256 (MRS, Pittsburgh, 1992).
    • (1992) Light Emission from Silicon
  • 16
    • 85037920224 scopus 로고    scopus 로고
    • M. Rückschloss, Ph.D. thesis, Tech. Univ. Munich (1993);M. Rückschloss and S. Veprek (unpublished).
    • Rückschloss, M.1    Veprek, S.2
  • 28
    • 0542408708 scopus 로고    scopus 로고
    • James L. Gole, Frank P. Dudel, David Grantier, and David A. Dixon, Phys. Rev. B 56, 2137 (1997).
    • (1997) Phys. Rev. B , vol.56 , pp. 2137


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.