Crystal structure and microstructure of epitaxial Pb(Zr,Ti) O3 films consisting of mixed phases with tetragonal and rhombohedral symmetries grown on (100)cSrRuO3// (100)SrTiO3 substrate by metalorganic chemical vapor deposition

Journal of Materials Research

Volumn 22, Issue 6, 2007, Pages 1551-1557

  Yokoyama, Shintaro ^a   Morioka, Hitoshi ^a   Kim, Yong Kwan ^a   Nakaki, Hiroshi ^a   Funakubo, Hiroshi ^a   Saito, Keisuke ^b   Nishida, Ken ^c   Katoda, Takashi ^c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b BRUKER AXS INC   (United States)

^c KOCHI UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; CURIE TEMPERATURE; FILM THICKNESS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; VOLUME FRACTION; X RAY DIFFRACTION ANALYSIS;

RHOMBOHEDRAL PHASE; TETRAGONAL PHASES;

EPITAXIAL FILMS;

EID: 34347272594     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2007.0190     Document Type: Article

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