Electrical cutting and nicking of carbon nanotubes using an atomic force microscope

Applied Physics Letters

Volumn 80, Issue 23, 2002, Pages 4446-4448

  Park, Ji Yong ^a   Yaish, Yuval ^a   Brink, Markus ^a   Rosenblatt, Sami ^a   McEuen, Paul L ^a  

^a Laboratory of Atomic and Solid State Physics and Cornell Center for Materials Research   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM TIP; ATOMIC FORCE MICROSCOPES; CARBON NANOTUBE DEVICES; CHARGING ENERGIES; METAL-COATED; SINGLE TUBES; SMALL QUANTUM DOTS; TUNNELING BARRIER; VOLTAGE PULSE;

ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL;

CARBON NANOTUBES;

EID: 79956028240     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1485126     Document Type: Article

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