Surface investigation of Si(1 0 0), Cu, Cu on Si(1 0 0), and Au on Cu with positron annihilation induced Auger-electron spectroscopy

Surface Science

Volumn 601, Issue 12, 2007, Pages 2459-2466

  Hugenschmidt, C ^a   Mayer, J ^a   Schreckenbach, K ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Auger electron emission; Metallic thin films; Positron annihilation; Positron beam; Positron solid interactions; Surface selectivity

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON ENERGY ANALYZERS; MONOLAYERS; PARTICLE INTERACTIONS; POSITRON ANNIHILATION; SURFACE STRUCTURE; THIN FILMS;

METALLIC THIN FILMS; POSITRON BEAMS; POSITRON SOLID INTERACTIONS; SURFACE SELECTIVITY;

POLYCRYSTALLINE MATERIALS;

EID: 34250010881     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.04.050     Document Type: Article

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