Investigation of the annealed copper surface by positron annihilation induced Auger electron spectroscopy

Radiation Physics and Chemistry

Volumn 68, Issue 3-4, 2003, Pages 627-629

  Strasser B ^a   Hugenschmidt, C ^a   Schreckenbach, K ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Auger spectroscopy; PAES; Polycrystalline copper; Positron beam

Indexed keywords

ANNEALING; ELECTROSTATICS; POSITRON ANNIHILATION SPECTROSCOPY;

POSITRON BEAMS;

COPPER;

COPPER ION;

ANALYTIC METHOD; AUGER ELECTRON SPECTROSCOPY; COMPARATIVE STUDY; CONFERENCE PAPER; CRYSTALLIZATION; ELECTRIC ACTIVITY; ELECTRON BEAM; ENERGY ABSORPTION; MEASUREMENT; SAMPLE;

EID: 0141832169     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0969-806X(03)00250-0     Document Type: Conference Paper

References (4)

1. Hugenschmidt C., Kögel G., Repper R., Schreckenbach K., Sperr P., Straßer B., Triftshäuser W. Mater. Sci. Forum. 363-365:2001;425-429.
2. Mehl D., Köymen A.R., Jensen K.O., Gotwald F., Weiss A. Phys. Rev. B. 41:1990;799.
3. Strasser B., Hugenschmidt C., Schreckenbach K. Mater. Sci. Forum. 363-365:2001;686-688.
4. Weiss A., Mayer R., Jibaly M., Lei C., Mehl D., Lynn K.G. Phys. Rev. Lett. 61:1988;2245.