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Volumn 305, Issue 1, 2007, Pages 50-54

Effect of annealing on the residual stress and strain distribution in CdZnTe wafers

(5) Zeng, Dongmei a Jie, Wanqi a Zha, Gangqiang a Wang, Tao a Yang, Ge a

a NORTHWESTERN POLYTECHNICAL UNIVERSITY (China)

Author keywords

A1. Annealed; A1. Lattice misfit; A1. Precipitate; A1. Residual stress and strain; A1. X ray diffraction; B2. CdZnTe; B2. Semiconducting II VI materials

Indexed keywords

ANNEALING; POINT DEFECTS; PRECIPITATES; RESIDUAL STRESSES; SEMICONDUCTOR MATERIALS; STRAIN; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

COMPOSITION HOMOGENIZATION; DISLOCATION GLIDING; INFRARED (IR) TRANSMISSION ANALYSES; LATTICE MISFIT;

CADMIUM COMPOUNDS;

EID: 34249867925 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2007.04.021 Document Type: Article

Times cited : (21)

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