Residual stress and strain in CdZnTe wafer examined by X-ray diffraction methods

Applied Physics A: Materials Science and Processing

Volumn 86, Issue 2, 2007, Pages 257-260

  Zeng, D ^a   Jie, W ^a   Wang, T ^a   Zha, G ^a  

^a NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

RESIDUAL STRESSES; SINGLE CRYSTALS; STRAIN MEASUREMENT; THERMAL STRESS; X RAY DIFFRACTION ANALYSIS;

MECHANICAL STRESSES; MISFIT STRESS; NON-UNIFORM STRAIN;

CADMIUM COMPOUNDS;

EID: 33845335519     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-006-3765-z     Document Type: Article

References (10)

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3. G.K. Williamson, W.H. Hall, Acta Metall. 22 (1953)
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10. H. Lipson, in Symp. Internal Stresses in Metals and Alloys (London, 1948), p. 35