X-ray stress measurement method for single crystal with unknown stress-free lattice parameter

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 5 A, 2003, Pages 2876-2880

  Suzuki, Hiroshi ^a   Akita, Koichi ^b   Misawa, Hiroshi ^a  

^a TOKYO METROPOLITAN UNIVERSITY   (Japan)

^b TOKYO CITY UNIVERSITY   (Japan)

Author keywords

Lattice parameter; Residual stress; Silicon; Single crystal; X ray stress measurement

Indexed keywords

CRYSTAL LATTICES; ELECTROMAGNETIC WAVE DIFFRACTION; REGRESSION ANALYSIS; RESIDUAL STRESSES; STRESS ANALYSIS;

X-RAY STRESS;

SINGLE CRYSTALS;

EID: 0037704657     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.2876     Document Type: Article

References (13)

1. X Sen Oryoku Sokutei Ho (X-Ray Stress Measuring Method), ed. Society of Materials Science Japan (Yokendo, Tokyo, 1990) 2nd ed., p. 60 [in Japanese].
2. E. C. Dickey, V. P. Dravid and C. R. Hubbard: J. Am. Ceram. Soc. 80 (1997) 2773.
3. T. Yoshiike, N. Fujii and S. Kozaki: Jpn. J. Appl. Phys. 36 (1997) 5764.
4. A. Ward III and R. W. Hendricks: Proc. 5th Int. Conf. Residual Stresses, Sweden, 1997, p. 1054.
5. M. Barral and J. M. Sprauel: Proc. 1st Int. Conf. Residual Stresses, Germany, 1987, p. 265.
6. Y. Yoshioka, S. Ohya and Y. Suyama: Proc. 5th Int. Conf. Residual Stresses, Sweden, 1997, p. 528.
7. S. Ohsawa, A. Inagaki and F. Kikuta: Seikatsu Kagaku no Tame no Tahenryo Kaiseki (Multivariate Analysis for Life Science) (Kasei Kyoiku sha, Tokyo, 1992) p. 34 [in Japanese].
8. T. Goto: Proc. 6th Int. Conf. Residual Stresses, Oxford, 2000, p. 327.
9. W. F. Hosford: The Mechanics of Crystals and Textured Polycrystals (Oxford University Press, New York, 1993) p. 16.
10. H. Suzuki, K. Akita and H. Misawa: Mater. Sci. Res. Int. 6 (2000) 255.
11. Y. Waku, N. Nakagawa, T. Wakamoto, H. Ohtsubo, K. Shimizu and Y. Kohtoku: Nature 389 (1997) 49.
12. H. Suzuki, K. Akita, Y. Yoshioka, Y. Waku and H. Misawa: Proc. 38th Symp. X-ray Studies on Mechanical Behavior of Materials, Kyoto, 2002, p. 59 [in Japanese].
13. H. Suzuki, K. Akita, H. Misawa and M. Imafuku: J. Soc. Mater. Sci. 51 (2002) 730 [in Japanese].