Study of the charge collection efficiency of CdZnTe radiation detectors

Journal of Electronic Materials

Volumn 25, Issue 8, 1996, Pages 1221-1231

  Nemirovsky, Y ^a   Ruzin, A ^a   Asa, G ^a   Gorelik, J ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

CdZnTe; Radiation detectors; Schottky diode

Indexed keywords

EID: 0001210006     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02655012     Document Type: Article

References (11)

1. J.F. Butler, Properties of Narrow Gap Cadmium-based Compounds, ed. P. Capper, emis data reviews series, No.10 (London: INSPEC, 1994), p. 587.
2. C.J. Johnson, E.E. Eissler, S.E. Cameron, Y. Kong, S. Fan, S. Yovanovic and K.G. Lynn, Mater. Res. Soc. Symp. Proc. 299 (Pittsburgh, PA: Mater. Res. Soc., 1994), p. 215.
3. eV products, div. of II-VI Incorporated, 375 Saxonburg Blvd., Saxonburg, PA 16056.
4. E. Raiskin and J.F. Butler, IEEE Trans. Nucl. Sci. NS-35, 82 (1988).
5. M. Hage-Ali and P. Siffert, Mater. Res. Soc. Symp. Proc. 299 (Pittsburgh, PA: Mater Res. Soc, 1994), p. 231.
6. J.F. Butler, F.P. Doty, B. Apotovsky, S.J. Friesenham and C. Lingren, Mater. Res. Soc. Symp. Proc. 299 (Pittsburgh, PA: Mater. Res. Soc., 1994), p. 249.
7. A. W. Brinkman, Properties of Narrow Gap Cadmium-based Compounds, ed. P. Capper, emis data reviews series, No.10 (London: INSPEC, 1994), p. 575.
8. J.F. Butler, F.P. Doty and C. Lingren, IEEE Trans. on Nucl. Sci. NS-39, 291 (1993).
9. A. Ruzin, J. Gorelik and Y. Nemirovsky, Proc. 18th IEEE Convention Electrical and Electronics Engineers, Israel, March 1995, Tel Aviv, p. 3.5.2.
10. Glenn F. Knoll, Radiation Detection and Measurement, 2nd ed. (New York: Wiley, 1989).
11. F.P. Doty Properties of Narrow Gap Cadmium-based Compounds, ed. P. Capper, emis data reviews series, No.10 (London: INSPEC, 1994), p. 540.