Electrical current induced pinhole formation and insulator-metal transition in tunnel junctions

Journal of Physics Condensed Matter

Volumn 19, Issue 17, 2007, Pages

  Ventura, J ^a,b   Zhang, Z ^c,d   Liu, Y ^c,e   Sousa, J B ^a,b   Freitas, P P ^a,c  

^a IN   (Portugal)

^b UNIVERSITY OF PORTO   (Portugal)

^c INESC   (Portugal)

^d FUDAN UNIVERSITY   (China)

^e TONGJI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; ELECTRODES; ELECTROMIGRATION; FERROMAGNETIC MATERIALS;

BARRIER DEGRADATION; INSULATING BARRIER; INSULATOR-METAL TRANSITION; NANOCONSTRICTIONS; PINHOLE FORMATION;

TUNNEL JUNCTIONS;

EID: 34249092639     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/19/17/176207     Document Type: Article

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