Current driven resistance changes in low resistance x area magnetic tunnel junctions with ultra-thin Al-Ox barriers

Journal of Applied Physics

Volumn 95, Issue 11 II, 2004, Pages 6792-6794

  Deac, A ^a   Redon, O ^a   Sousa, R C ^a   Dieny, B ^a   Nozieres J P ^a   Zhang, Z ^b   Liu, Y ^b   Freitas, P P ^b  

^a CEA GRENOBLE   (France)

^b INESC   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; ANTIFERROMAGNETIC MATERIALS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; ELECTROMIGRATION; ETCHING; ION BEAMS; LITHOGRAPHY; MAGNETIC FIELD EFFECTS; MAGNETIZATION; MAGNETORESISTANCE; TRANSMISSION ELECTRON MICROSCOPY;

CURRENT INDUCED MAGNETIC SWITCHING (CIMS); JOULE HEATING; MAGNETIC TUNNEL JUNCTIONS (MTJ); OHMIC CONDUCTION;

TUNNEL JUNCTIONS;

EID: 2942679317     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1687533     Document Type: Conference Paper

References (15)

1. L. Berger, Phys. Rev. B 54, 9353 (1996); J. Appl. Phys. 91, 6795 (2002).
2. L. Berger, Phys. Rev. B 54, 9353 (1996); J. Appl. Phys. 91, 6795 (2002).
3. J. C. Slonczewski, J. Magn. Magn. Mater. 159, L1 (1996); 195, L261 (1999).
4. J. C. Slonczewski, J. Magn. Magn. Mater. 159, L1 (1996); 195, L261 (1999).
5. Y. Huai, P. P. Nguyen, and F. Albert, Proceedings of IMST 2003 (unpublished).
6. J. A. Katine, F. J. Albert, R. A. Buhrman, E. B. Myers, and D. C. Ralph, Phys. Rev. Lett. 84, 3149 (2000).
7. J. Grollier, V. Cros, A. Hamzic, J. M. George, H. Jaffres, A. Fert, G. Faini, J. Ben Youssef, and H. Legall, Appl. Phys. Lett. 78, 3663 (2001).
8. S. Urazhdin, H. Kurt, W. P. Pratt, and J. Bass, Appl. Phys. Lett. 83, 114 (2003).
9. E. B. Myers, F. J. Albert, J. C. Stankey, E. Bonet, R. A. Buhrman, and D. C. Ralph, Phys. Rev. Lett. 89, 196801 (2002).
10. J. E. Wegrowe, X. Hoffer, Ph. Guittienne, A. Fabian, L. Gravier, T. Wade, and J. P. Ansermet, J. Appl. Phys. 91, 6806 (2002).
11. J. Z. Sun, D. J. Monsma, M. J. Rooks, and R. H. Koch, Appl. Phys. Lett. 81, 2202 (2002).
12. Z. G. Zhang, Z. Z. Zhang, and P. P. Freitas, J. Appl. Phys. 93, 8552 (2003).
13. J. Wang, Y. Liu, P. P. Freitas, E. Snoeck, and J. L. Martins, J. Appl. Phys. 93, 8367 (2003).
14. J. S. Bae, K. H. Shin, and H. M. Lee, J. Appl. Phys. 91, 7947 (2002).
15. Y. Liu, Z. Zhang, and P. P. Freitas, IEEE Trans. Magn. 39, 2833 (2003).