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Volumn 36, Issue 5, 2007, Pages 562-567

In-situ observation of electromigration in eutectic SnPb solder lines: Atomic migration and Hillock formation

Author keywords

Electromigration; Eutectic SnPb; Hillocks; In situ observation

Indexed keywords

ATOMIC SIZE FACTORS; HILLOCK PHASES; IN-SITU OBSERVATION; ROOM TEMPERATURE;

CURRENT DENSITY; ELECTROMIGRATION; EUTECTICS; MICROSTRUCTURAL EVOLUTION; SCANNING ELECTRON MICROSCOPY; TIN ALLOYS;

SOLDERING ALLOYS;

EID: 34249076385 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-007-0102-z Document Type: Article

Times cited : (11)

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