메뉴 건너뛰기




Volumn 36, Issue 4, 2007, Pages 332-339

Chemical vapor deposition of silicon carbide epitaxial films and their defect characterization

Author keywords

Characterization; Chemical vapor deposition (CVD); Dislocations; Epitaxial growth; Silicon carbide (SiC); Synchrotron x ray topography; X ray topography

Indexed keywords

SYNCHROTRON X-RAY TOPOGRAPHY; X-RAY TOPOGRAPHY;

EID: 34249076132     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-006-0084-2     Document Type: Conference Paper
Times cited : (8)

References (21)
  • 7
    • 34249018305 scopus 로고    scopus 로고
    • G. Dhanaraj, X.R. Huang, M. Dudley, V. Prasad, R.H. M. in Crystal Growth Technology, ed. K. Byrappa T. Ohachi, William Andrew (New York: Springer, 2003), pp. 181-232.
    • G. Dhanaraj, X.R. Huang, M. Dudley, V. Prasad, R.H. M. in Crystal Growth Technology, ed. K. Byrappa T. Ohachi, William Andrew (New York: Springer, 2003), pp. 181-232.
  • 20
    • 34249087449 scopus 로고    scopus 로고
    • G. Dhanaraj (Invited presentation at II-VI Inc., NJ USA Jan, 3, 2005).
    • G. Dhanaraj (Invited presentation at II-VI Inc., NJ USA Jan, 3, 2005).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.