Defect characterization for scaling of QCA devices

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2004, Pages 30-38

  Huang, Jing ^a   Momenzadeh, Mariam ^a   Tahoori, Mehdi B ^a   Lombardi, Fabrizio ^a  

^a Northeastern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARTESIAN LAYOUT; CELL-TO-CELL SPACING; LOGIC BLOCKS; QUANTUM DOT CELLULAR AUTOMATA (QCA);

AUTOMATA THEORY; COMPUTER SIMULATION; ERROR ANALYSIS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 24944551041     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFTVS.2004.1347822     Document Type: Conference Paper

References (14)

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