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Volumn 54, Issue 5, 2007, Pages 1069-1076

A 4-kb low-power SRAM design with negative word-line scheme

Author keywords

4 T SRAM cell; Leakage current; Negative word line (NWL); Power delay product; SRAM

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC POWER UTILIZATION; LEAKAGE CURRENTS; STANDBY POWER SYSTEMS; TRANSISTORS;

EID: 34248673198     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2006.888767     Document Type: Article
Times cited : (37)

References (14)
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    • A 4-kb 500-MHz 4-T CMOS SRAM using low-Vthn bitline drivers and high-Vthp latches
    • Sep
    • C.-C.Wang, Y.-L. Tseng, H.-Y. Leo, and R. Hu, "A 4-kb 500-MHz 4-T CMOS SRAM using low-Vthn bitline drivers and high-Vthp latches," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 12, no. 9, pp. 901-909, Sep. 2004.
    • (2004) IEEE Trans. Very Large Scale Integr. (VLSI) Syst , vol.12 , Issue.9 , pp. 901-909
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  • 10
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    • A 4-kb 667-MHz CMOS SRAM using dynamic threshold voltage wordline transistors
    • Feb
    • C.-C.Wang, T.-H. Chen, and R. Hu, "A 4-kb 667-MHz CMOS SRAM using dynamic threshold voltage wordline transistors," in Proc. 2003 Southwest Symp. Mixed-Signal Design, Feb. 2003, pp. 90-93.
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    • A 1.26-ns access time current-mode sense amplifier design for embedded SRAMs
    • Aug
    • C.-C.Wang, Y.-L. Tseng, C.-C. Li, and R. Hu, "A 1.26-ns access time current-mode sense amplifier design for embedded SRAMs," in Proc. 14th VLSI Design/CAD Symp., Aug. 2003, vol. C3-6, pp. 377-380.
    • (2003) Proc. 14th VLSI Design/CAD Symp , vol.C3-6 , pp. 377-380
    • Wang, C.C.1    Tseng, Y.-L.2    Li, C.-C.3    Hu, R.4
  • 13
    • 0035696648 scopus 로고    scopus 로고
    • A loadless CMOS four-transistor SRAM cell in a 0:18 - μm logic technology
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    • K. Noda, K. Matsui, K. Takeda, and N. Nakamura, "A loadless CMOS four-transistor SRAM cell in a 0:18 - μm logic technology," IEEE Trans. Electron Devices, vol. 48, no. 12, pp. 2851-2856, Dec. 2001.
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    • Available
    • [Online]. Available: http://www.labs.nec.co.jp/Eng/Topics/data/r000131/


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.