Precise on-chip voltage generator for a gigascale DRAM with a negative word-line scheme

IEEE Journal of Solid-State Circuits

Volumn 34, Issue 8, 1999, Pages 1084-1090

  Tanaka, Hitoshi ^a   Aoki, Masakazu ^a   Sakata, Takeshi ^a   Kimura, Shin'ichiro ^a   Sakashita, Narumi ^b   Hidaka, Hideto ^b   Tachibana, Tadashi ^c   Kimura, Katsutaka ^a  

^a HITACHI LTD   (Japan)

^b MITSUBISHI ELECTRIC CORPORATION   (Japan)

^c Texas Instruments Japan Ltd   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIFFERENTIAL AMPLIFIERS; DYNAMIC RANDOM ACCESS STORAGE; INTEGRATED CIRCUIT TESTING; THRESHOLD VOLTAGE;

BANDGAP GENERATOR; CHARGE PUMP REGULATOR; SERIES PASS REGULATOR; VOLTAGE GENERATOR;

VOLTAGE REGULATORS;

EID: 0033169550     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.777106     Document Type: Article

References (6)

1. T. Yamagata, S. Tomishima, M. Tsukude, T. Tsuruda, Y. Hashizume. and K. Arimoto, "Low voltage circuit design techniques for battery-operated and/or G scale DRAM's," IEEE J. Solid-State Circuits, vol. 30, pp. 1183-1188, Nov. 1995.
2. T. Hamamoto, S. Sugiura, and S. Sawada, "Well conception: A novel scaling limitation factor derived from DRAM retention time and its modeling," in IEDM Dig. Tech. Papers, Dec. 1995, pp. 915-918.
3. H. Tanaka, M. Aoki, J. Etoh, M. Horiguchi, K. Itoh, K. Kajigaya and T. Matsumoto, "Stabilization of voltage limiter circuit for high-density DRAM's using pole-zero compensation," IEICE Trans. Electron., vol. E75-C, no. 11, pp. 1333-1343, Nov. 1992.
4. P. R. Gray and R. G. Meyer, Analysis and Design of Analog Integrated Circuits, 2nd ed. New York: Wiley, chs. 4 and 12.
5. P. E. Allen and D. R. Holberg, CMOS Analog Circuit Design. New York: Holt, Rinehart and Winston, 1987. ch. 11.
6. H. Tanaka, M. Aoki, T. Sakata, S. Kimura, N. Sakashita, H. Hidaka, T. Tachibana, and K. Kimura, "A precise on-chip voltage generator for a giga-scale DRAM with a negative word-line scheme," in Symp. VLSI Circuits Dig. Tech. Papers, June 1998, pp. 94-95.