-
2
-
-
4544327926
-
MoSys explains 1T-SRAM technology
-
Sept.
-
P. N. Glaskowsky, "MoSys explains 1T-SRAM technology," Microprocessor Rep., vol. 13, no. 12, pp. 1-2, Sept. 1999.
-
(1999)
Microprocessor Rep.
, vol.13
, Issue.12
, pp. 1-2
-
-
Glaskowsky, P.N.1
-
3
-
-
0034316440
-
A 16-Mb 400-MHz loadless CMOS four-transistor SRAM macro
-
Nov.
-
K. Takeda, Y. Aimoto, N. Nakamura, H. Toyoshima, T. Iwasaki, K. Noda, K. Matsui, S. Itoh, S. Masuoka, T. Horiushi, A. Nakagawa, K. Shimogawa, and H. Takahashi, "A 16-Mb 400-MHz loadless CMOS four-transistor SRAM macro," IEEE J. Solid-State Circuits, vol. 35, pp. 1631-1640, Nov. 2000.
-
(2000)
IEEE J. Solid-state Circuits
, vol.35
, pp. 1631-1640
-
-
Takeda, K.1
Aimoto, Y.2
Nakamura, N.3
Toyoshima, H.4
Iwasaki, T.5
Noda, K.6
Matsui, K.7
Itoh, S.8
Masuoka, S.9
Horiushi, T.10
Nakagawa, A.11
Shimogawa, K.12
Takahashi, H.13
-
4
-
-
4544319574
-
Low-power 2P2N SRAM with column hidden refresh
-
Aug.
-
H.-Y. Huang and X.-Y. Su, "Low-power 2P2N SRAM with column hidden refresh," in Proc. 12th VLSI Design/CAD Symp., vol. C3-8, Aug. 2001, p. 64.
-
(2001)
Proc. 12th VLSI Design/CAD Symp.
, vol.C3-8
, pp. 64
-
-
Huang, H.-Y.1
Su, X.-Y.2
-
5
-
-
0026260669
-
A 8-Mb SRAM operating at 2.6 ± 1 V with 3-μ A data retention current
-
Nov.
-
K. Sato, K. Kenmizaki, S. Kubono, T. Mochizuki, H. Aoyagi, M. Kanamitsu, S. Kunito, H. Uchida, Y. Yasu, A. Ogishima, S. Sano, and H. Kawamoto, "A 8-Mb SRAM operating at 2.6 ± 1 V with 3-μ A data retention current," IEEE J. Solid-State Circuits, vol. 26, pp. 1556-1562, Nov. 1991.
-
(1991)
IEEE J. Solid-state Circuits
, vol.26
, pp. 1556-1562
-
-
Sato, K.1
Kenmizaki, K.2
Kubono, S.3
Mochizuki, T.4
Aoyagi, H.5
Kanamitsu, M.6
Kunito, S.7
Uchida, H.8
Yasu, Y.9
Ogishima, A.10
Sano, S.11
Kawamoto, H.12
-
6
-
-
0032001924
-
Dual-period self-refresh scheme for low-power DRAM's with on-chip PROM mode registers
-
Feb.
-
Y. Idei, K. Shimohigashi, M. Aoki, H. Noda, H. Iwai, K. Sato, and T. Tachibana, "Dual-period self-refresh scheme for low-power DRAM's with on-chip PROM mode registers," IEEE J. Solid-State Circuits, vol. 33, pp. 253-259, Feb. 1998.
-
(1998)
IEEE J. Solid-state Circuits
, vol.33
, pp. 253-259
-
-
Idei, Y.1
Shimohigashi, K.2
Aoki, M.3
Noda, H.4
Iwai, H.5
Sato, K.6
Tachibana, T.7
-
7
-
-
0003476558
-
-
Piscataway, NJ: IEEE Press
-
R. J. Baker, H. W. Li, and D. E. Boyce, CMOS Citcuit Design, Layout, and Simulation. Piscataway, NJ: IEEE Press, 1998.
-
(1998)
CMOS Citcuit Design, Layout, and Simulation
-
-
Baker, R.J.1
Li, H.W.2
Boyce, D.E.3
-
8
-
-
0033362678
-
Power minimization of high-performance submicron CMOS circuits using a dual-Vdd dual-Vth (DVDV) approach
-
M. M. Khellah and M. I. Elmasry, "Power minimization of high-performance submicron CMOS circuits using a dual-Vdd dual-Vth (DVDV) approach," in Proc. Int. Symp. Low-Power Electronics and Design, 1999, pp. 106-108.
-
(1999)
Proc. Int. Symp. Low-power Electronics and Design
, pp. 106-108
-
-
Khellah, M.M.1
Elmasry, M.I.2
-
9
-
-
0032186544
-
Performance and vdd scaling in deep submicrometer CMOS
-
Oct.
-
K. Chen and C. Hu, "Performance and vdd scaling in deep submicrometer CMOS," IEEE J. Solid-State Circuits, vol. 33, pp. 1586-1589, Oct. 1998.
-
(1998)
IEEE J. Solid-state Circuits
, vol.33
, pp. 1586-1589
-
-
Chen, K.1
Hu, C.2
-
10
-
-
0032167226
-
T self-timed CMOS logic for low subthreshold current multigigabit synchronous DRAM
-
Sept.
-
T self-timed CMOS logic for low subthreshold current multigigabit synchronous DRAM," IEEE Trans. Circuits Syst. II, vol. 45, pp. 1263-1271, Sept. 1998.
-
(1998)
IEEE Trans. Circuits Syst. II
, vol.45
, pp. 1263-1271
-
-
Yoo, H.-J.1
-
11
-
-
84966351847
-
Address transition detector with high noise immunity
-
Aug.
-
C.-C. Wang and J.-J. Wang, "Address transition detector with high noise immunity," in Proc. 12th VLSI Design CAD Symp., vol. C3-3, Aug. 2001, p. 62.
-
(2001)
Proc. 12th VLSI Design CAD Symp.
, vol.C3-3
, pp. 62
-
-
Wang, C.-C.1
Wang, J.-J.2
-
12
-
-
0035308547
-
The impact of intrinsic device flunactions on CMOS SRAM cell stability
-
Apr.
-
A. J. Bhavnagarwala, X. Tang, and J. D. Meindl, "The impact of intrinsic device flunactions on CMOS SRAM cell stability," IEEE J. Solid-State Circuits, vol. 36, pp. 658-665, Apr. 2001.
-
(2001)
IEEE J. Solid-state Circuits
, vol.36
, pp. 658-665
-
-
Bhavnagarwala, A.J.1
Tang, X.2
Meindl, J.D.3
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