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Volumn 42, Issue 1, 2007, Pages 150-156

Surfactant-aided supercritical carbon dioxide drying for photoresists to prevent pattern collapse

Author keywords

Pattern collapse; Photoresist; Supercritical carbon dioxide; Surfactant; Wafer cleaning

Indexed keywords

CARBON DIOXIDE; CHAIN LENGTH; COPOLYMERS; DRYING; HYDROCARBONS; PHOTORESISTS; SCANNING ELECTRON MICROSCOPY; SURFACE ACTIVE AGENTS;

EID: 34248662085     PISSN: 08968446     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.supflu.2006.12.014     Document Type: Article
Times cited : (22)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.