Forming N-detection test sets without test generation

ACM Transactions on Design Automation of Electronic Systems

Volumn 12, Issue 2, 2007, Pages

  Pomeranz, Irith ^a   Reddy, Sudhakar M ^b,c  

^a PURDUE UNIVERSITY   (United States)

^b UNIVERSITY OF IOWA   (United States)

^c University of Iowa   (United States)

Author keywords

Bridging faults; n detection test sets; Stuck at faults; Test generation

Indexed keywords

BRIDGING FAULTS; N-DETECTION TEST SETS; TEST CUBES; TEST GENERATION;

COMPUTER SIMULATION; FAULT DETECTION; RANDOM PROCESSES; SET THEORY; VECTORS;

ELECTRONIC EQUIPMENT TESTING;

EID: 34248395554     PISSN: 10844309     EISSN: 15577309     Source Type: Journal    
DOI: 10.1145/1230800.1230810     Document Type: Article

References (9)

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