Enhanced DO-RE-ME based defect level prediction using defect site aggregation - MPG-D

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 930-939

  Dworak, Jennifer ^a   Grimaila, Michael R ^a   Lee, Sooryong ^a   Wang, Li C ^a   Mercer, M Ray ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; COMPUTER SIMULATION; DESIGN FOR TESTABILITY; ELECTRIC EXCITATION; FAILURE ANALYSIS; PROBABILITY; VECTORS;

AUTOMATIC TEST PATTERN GENERATION; DEFECT SITE AGGREGATION; DEFECTIVE PART LEVEL ESTIMATION; DETERMINISTIC OBSERVATION RANDOM EXCITATION;

INTEGRATED CIRCUIT TESTING;

EID: 0034476103     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)