Functional verif icat ion of a mu it i ple-issue, out-of-order, superscalar alpha processor- The dec alpha 21264 microprocessor

Proceedings - Design Automation Conference

Volumn , Issue , 1998, Pages 638-643

  Taylor, Scott ^a   Quinn, Michael ^a   Brown, Darren ^a   Dohm, Nathan ^a   Hildebrandt, Scot ^a   Huggins, James ^a   Ramey, Carl ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

Alpha; Architecture; Coverage analysis 21264; Microprocessor; Pseudo random; Validation; Verification

Indexed keywords

ARCHITECTURE; DESIGN; MICROPROCESSOR CHIPS; VERIFICATION; BUFFER STORAGE; COMPUTER SIMULATION; RANDOM PROCESSES; RESPONSE TIME (COMPUTER SYSTEMS); TIMING CIRCUITS;

ALPHA; COVERAGE ANALYSIS; FUNCTIONAL COVERAGE; FUNCTIONAL VERIFICATION; INSTRUCTIONS PER CYCLES; MULTIPLE OPERATING SYSTEMS; PSEUDO RANDOM; VALIDATION;

AUTOMATION; COMPUTER AIDED NETWORK ANALYSIS;

FUNCTIONAL VERIFICATION;

EID: 0031639694     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Linley Gwennap, "Digital 21264 Sets New Standard, " Microprocessor Report (October 28, 1996): 11-16.
2. Mike Kantrowitz and Lisa Noack, "Functional Verification of a Multiple-issue, Pipelined, Superscalar Alpha Processor-the Alpha 21164 CPU Chip, " Digital Technical Journal, vol. 7, no. 1 (1995): 136-143.
3. W. Anderson, "Logical Verification of the NVAX CPU Chip Design, " Digital Technical Journal, vol. 4, no. 3 (Summer 1992): 38-46.
4. A. Aharon, A. Bar-David, B. Dorfman, E. Gofman, M. Leibowitz, and V. Schwartzburd, "Verification of the IBM RISC System/6000 by a Dynamic Biased Pseudo-random Test Program Generator, " IBM Systems Journal, vol. 30, no. 4 (1991):527-538.
5. A. Ahi, G. Burroughs, A. Gore, S. LaMar, C-Y. Lin, and A. Wiemann, "Design Verification of the HP 9000 Series 700 PA-RISC Workstations, " Hewlett-Packard Journal (August 1992): 34-42.
6. D. Wood, G. Gibson, and R. Katz, "Verifying a Multiprocessor Cache Controller Using Random Test Generation, " IEEE Design and Test of Computers (August 1990): 13-25.