Determination and validation of new nonlinear FinFET model based on lookup tables

IEEE Microwave and Wireless Components Letters

Volumn 17, Issue 5, 2007, Pages 361-363

  Crupi, Giovanni ^b,c   Schreurs, Dominique M M P ^a,c   Xiao, Dongping ^c,d   Caddemi, Alina ^b   Parvais, Bertrand ^d   Mercha, Abdelkarim ^d   Decoutere, Stefaan ^d  

^a IEEE

^b UNIVERSITY OF MESSINA   (Italy)

^c UNIVERSITY OF LEUVEN   (Belgium)

^d IMEC   (Belgium)

Author keywords

Fin field effect transistor (FinFET); Large signal measurements; Lookup table; Multiple gate structure; Nonlinear model

Indexed keywords

CMOS INTEGRATED CIRCUITS; NANOTECHNOLOGY; NONLINEAR ANALYSIS; TABLE LOOKUP;

FIN FIELD EFFECT TRANSISTOR (FINFET); LARGE SIGNAL MEASUREMENTS; MULTIPLE GATE STRUCTURE; NONLINEAR MODEL;

GATES (TRANSISTOR);

EID: 34247589328     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2007.895711     Document Type: Article

References (11)

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