Surface microstructure of GeSbSe chalcogenide thin films grown at oblique angle

Journal of Applied Physics

Volumn 101, Issue 8, 2007, Pages

  Martin Palma R J ^a   Ryan, J V ^a   Pantano, C G ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GERMANIUM COMPOUNDS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SURFACE PHENOMENA; THIN FILMS;

SPECTRAL DENSITY ANALYSIS; SURFACE MICROSTRUCTURE;

CHALCOGENIDES;

EID: 34247584647     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2717261     Document Type: Conference Paper

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