Extraction of π-type substrate resistance based on three-port measurement and the model verification up to 110 GHz

IEEE Electron Device Letters

Volumn 28, Issue 5, 2007, Pages 425-427

  Kang, In Man ^a   Lee, Jong Duk ^a   Shin, Hyungcheol ^a  

^a Seoul National University   (South Korea)

Author keywords

Macromodel; RF MOSFETs; Substrate resistance; Three port

Indexed keywords

ELECTRIC ADMITTANCE; EXTRACTION; FREQUENCY METERS; MATHEMATICAL MODELS; SUBSTRATES;

OUTPUT ADMITTANCE; SUBSTRATE RESISTANCE; THREE-PORT MEASUREMENT;

MOSFET DEVICES;

EID: 34247579207     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2007.895395     Document Type: Article

References (8)

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