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Volumn 24, Issue 3, 2003, Pages 183-185

Gate bias dependence of the substrate signal coupling effect in RF MOSFETs

Author keywords

CMOS RF modeling; RF MOSFET; Substrate resistance; Substrate signal coupling

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC ADMITTANCE; ELECTRIC RESISTANCE; GATES (TRANSISTOR); RESISTORS; SCATTERING PARAMETERS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES; SUBSTRATES;

EID: 0038275857     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2003.809530     Document Type: Letter
Times cited : (10)

References (10)
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    • S. H.-M. Jen, C. C. Enz, D. R. Pehlke, M. Schröter, and B. J. Sheu, "Accurate modeling and parameter extraction for MOS transistors valid up to 10 GHz," IEEE Trans. Electron Devices, vol. 46, pp. 2217-2227, Nov. 1999.
    • (1999) IEEE Trans. Electron Devices , vol.46 , pp. 2217-2227
    • Jen, S.H.-M.1    Enz, C.C.2    Pehlke, D.R.3    Schröter, M.4    Sheu, B.J.5
  • 2
    • 0036602363 scopus 로고    scopus 로고
    • A simple and analytical parameter extraction method of MOSFET for microwave modeling
    • June
    • I. Kwon, M. Je, K. Lee, and H. Shin, "A simple and analytical parameter extraction method of MOSFET for microwave modeling," IEEE Trans. Microwave Theory Tech., vol. 50, pp. 1503-1509, June 2002.
    • (2002) IEEE Trans. Microwave Theory Tech. , vol.50 , pp. 1503-1509
    • Kwon, I.1    Je, M.2    Lee, K.3    Shin, H.4
  • 3
    • 0000552355 scopus 로고    scopus 로고
    • A simple subcircuit extension of the BSIM3v3 model for CMOS RF design
    • Apr.
    • S. F. Tin, A. A. Osman, K. Mayaram, and C. Hu, "A simple subcircuit extension of the BSIM3v3 model for CMOS RF design," IEEE J. Solid-State Circuits, vol. 35, pp. 612-624, Apr. 2000.
    • (2000) IEEE J. Solid-State Circuits , vol.35 , pp. 612-624
    • Tin, S.F.1    Osman, A.A.2    Mayaram, K.3    Hu, C.4
  • 4
    • 0022152815 scopus 로고
    • A small signal DC-to-high-frequency nonquasistatic model for the four-terminal MOSFET valid in all regions of operation
    • Nov.
    • M. Bagheri and Y. Tsividis, "A small signal DC-to-high-frequency nonquasistatic model for the four-terminal MOSFET valid in all regions of operation," IEEE Trans. Electron Devices, vol. ED-32, pp. 2383-2391, Nov. 1985.
    • (1985) IEEE Trans. Electron Devices , vol.ED-32 , pp. 2383-2391
    • Bagheri, M.1    Tsividis, Y.2
  • 7
    • 0036645960 scopus 로고    scopus 로고
    • A simple and accurate method for extracting substrate resistance of RF MOSFETs
    • July
    • J. Han, M. Je, and H. Shin, "A simple and accurate method for extracting substrate resistance of RF MOSFETs," IEEE Electron Device Lett., vol. 23, pp. 434-436, July 2002.
    • (2002) IEEE Electron Device Lett. , vol.23 , pp. 434-436
    • Han, J.1    Je, M.2    Shin, H.3
  • 8
    • 0034499762 scopus 로고    scopus 로고
    • On the high-frequency characteristics of substrate resistance in RF MOSFETs
    • Dec.
    • Y. Cheng and M. Matloubian, "On the high-frequency characteristics of substrate resistance in RF MOSFETs," IEEE Electron Device Lett., vol. 21, pp. 604-606, Dec. 2000.
    • (2000) IEEE Electron Device Lett. , vol.21 , pp. 604-606
    • Cheng, Y.1    Matloubian, M.2
  • 10
    • 0032140536 scopus 로고    scopus 로고
    • Extraction of high-frequency equivalent circuit parameters of submicron gate-length MOSFET's
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    • R. Sung, P. Bendix, and M. B. Das, "Extraction of high-frequency equivalent circuit parameters of submicron gate-length MOSFET's," IEEE Trans. Electron Devices, vol. 45, pp. 1769-1775, Aug. 1998.
    • (1998) IEEE Trans. Electron Devices , vol.45 , pp. 1769-1775
    • Sung, R.1    Bendix, P.2    Das, M.B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.