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Angewandte Chemie - International Edition

Volumn 43, Issue 20, 2004, Pages 2705-2709

Ultrafast electron crystallography of surface structural dynamics with atomic-scale resolution

(5) Vigliotti, Franco a Chen, Songye a Ruan, Chong Yu a Lobastov, Vladimir A a Zewail, Ahmed H a

a CALIFORNIA INSTITUTE OF TECHNOLOGY (United States)

Author keywords

Electron diffraction; Structural dynamics; Surface chemistry; X ray diffraction

Indexed keywords

CRYSTALLOGRAPHY; SUBSTRATES; SURFACE REACTIONS; X RAY DIFFRACTION ANALYSIS;

SURFACE STRUCTURAL DYNAMICS; ULTRAFAST ELECTRON CRYSTALLOGRAPHY;

ELECTRONS;

ARTICLE; CRYSTALLOGRAPHY; DIFFRACTION; SENSITIVITY AND SPECIFICITY; ULTRAFAST ELECTRON CRYSTALLOGRAPHY;

EID: 4544236626 PISSN: 14337851 EISSN: None Source Type: Journal
DOI: 10.1002/anie.200453983 Document Type: Article

Times cited : (44)

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