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Volumn 17, Issue 5, 2007, Pages 923-930
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Exploiting differential etch rates to fabricate large-scale nozzle arrays with protudent geometry
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Author keywords
[No Author keywords available]
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Indexed keywords
ETCHING;
GEOMETRY;
NANOTECHNOLOGY;
SCANNING;
SILICON NITRIDE;
NANOMETER SCALE;
NEAR-FIELD OPTICAL SCANNING;
PROTUDENT GEOMETRY;
NOZZLES;
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EID: 34247510625
PISSN: 09601317
EISSN: 13616439
Source Type: Journal
DOI: 10.1088/0960-1317/17/5/011 Document Type: Article |
Times cited : (6)
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References (21)
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