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Volumn 362, Issue 2-3, 2007, Pages 202-207

Silicon displacement threshold energy determined by electron paramagnetic resonance and positron annihilation spectroscopy in cubic and hexagonal polytypes of silicon carbide

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON IRRADIATION; PARAMAGNETIC RESONANCE; POINT DEFECTS; POSITRON ANNIHILATION SPECTROSCOPY; SINGLE CRYSTALS;

EID: 34247497256     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2007.01.023     Document Type: Article
Times cited : (18)

References (13)
  • 7
    • 34247500711 scopus 로고    scopus 로고
    • PENELOPE, .


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.