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Volumn 515, Issue 16 SPEC. ISS., 2007, Pages 6385-6390
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Yttrium oxide thin films: Influence of the oxygen vacancy network organization on the microstructure
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Author keywords
Crystallographic phases; Oxygen vacancy network; Rare Earth Oxyde; Thin film
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Indexed keywords
ELECTRON ENERGY LOSS SPECTROSCOPY;
MICROSTRUCTURE;
PHASE TRANSITIONS;
STOICHIOMETRY;
TRANSMISSION ELECTRON MICROSCOPY;
YTTRIUM OXIDE;
CRYSTALLOGRAPHIC PHASES;
OXYGEN VACANCY;
OXYGEN VACANCY NETWORK;
RARE EARTH OXIDE;
THIN FILMS;
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EID: 34247497202
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2006.11.177 Document Type: Article |
Times cited : (23)
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References (13)
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