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Volumn 90, Issue 14, 2007, Pages

200 femtometer sensitivity for near-field analysis of surface acoustic waves in a scanning electron / scanning probe microscope hybrid system

Author keywords

[No Author keywords available]

Indexed keywords

NEAR INFRARED SPECTROSCOPY; OPTICAL RESOLVING POWER; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

EID: 34047268916     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2721123     Document Type: Article
Times cited : (5)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.