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Volumn 90, Issue 14, 2007, Pages
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200 femtometer sensitivity for near-field analysis of surface acoustic waves in a scanning electron / scanning probe microscope hybrid system
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Author keywords
[No Author keywords available]
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Indexed keywords
NEAR INFRARED SPECTROSCOPY;
OPTICAL RESOLVING POWER;
SCANNING ELECTRON MICROSCOPY;
SCANNING PROBE MICROSCOPY;
FERROELECTRIC DOMAIN IMAGING;
VERTICAL SURFACE OSCILLATION;
ACOUSTIC WAVES;
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EID: 34047268916
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2721123 Document Type: Article |
Times cited : (5)
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References (15)
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