A perspective on today's scaling challenges and possible future directions

Solid-State Electronics

Volumn 51, Issue 4 SPEC. ISS., 2007, Pages 518-525

  Dennard, Robert H ^a   Cai, Jin ^a   Kumar, Arvind ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

CMOS; Limits; Power; Scaling; Variability

Indexed keywords

CMOS INTEGRATED CIRCUITS; CONSTRAINT THEORY; ELECTRIC INSULATORS; SYSTEMS ANALYSIS;

BACK-GATE DEVICES; INSULATOR SCALING;

MOSFET DEVICES;

EID: 34047254077     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2007.02.004     Document Type: Article

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