Analysis of vertical alignment and bending of crystalline α-Fe 2O3 nanowires using normal and grazing incidence x-ray diffraction intensities

Journal of Applied Physics

Volumn 101, Issue 6, 2007, Pages

  Deshpande, U P ^a   Shripathi, T ^a   Jain, D ^a   Narlikar, A V ^a   Deshpande, S K ^b   Fu, Y Y ^c  

^a UGC DAE CONSORTIUM FOR SCIENTIFIC RESEARCH   (India)

^b DEPARTMENT OF ATOMIC ENERGY   (India)

^c PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; DIFFRACTION PATTERNS; IRON COMPOUNDS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ALIGNMENT INDEX; DISORIENTED NANOWIRES; GRAZING INCIDENCE;

NANOWIRES;

EID: 34047165818     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2435076     Document Type: Article

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