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Volumn 287, Issue 1, 2000, Pages 78-86

A methodology development for the study of near surface stress gradients

Author keywords

Grazing incidence X ray diffraction; PVD chromium film; Residual stress gradients

Indexed keywords

CHROMIUM; MATHEMATICAL MODELS; MOLYBDENUM; SURFACE TREATMENT; SYNCHROTRON RADIATION; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS;

EID: 0033687239     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(00)00819-4     Document Type: Article
Times cited : (24)

References (32)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.