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Volumn 247, Issue 3-4, 2003, Pages 371-380
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HRTEM and GIXRD studies of CdS nanocrystals embedded in Al2O3 films produced by magnetron RF-sputtering
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Author keywords
A1. Glancing incidence X ray diffraction; A1. High resolution transmission electron microscopy; A1. RF sputtering; B1. Nanomaterials; B2. Semiconducting II VI materials
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Indexed keywords
ALUMINA;
CADMIUM SULFIDE;
DEPOSITION;
ELECTRON DIFFRACTION;
HIGH RESOLUTION ELECTRON MICROSCOPY;
MAGNETRON SPUTTERING;
SEMICONDUCTING FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
STRESS-FREE FILMS;
NANOSTRUCTURED MATERIALS;
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EID: 0037212095
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(02)01975-9 Document Type: Article |
Times cited : (24)
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References (13)
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