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Volumn 247, Issue 3-4, 2003, Pages 371-380

HRTEM and GIXRD studies of CdS nanocrystals embedded in Al2O3 films produced by magnetron RF-sputtering

Author keywords

A1. Glancing incidence X ray diffraction; A1. High resolution transmission electron microscopy; A1. RF sputtering; B1. Nanomaterials; B2. Semiconducting II VI materials

Indexed keywords

ALUMINA; CADMIUM SULFIDE; DEPOSITION; ELECTRON DIFFRACTION; HIGH RESOLUTION ELECTRON MICROSCOPY; MAGNETRON SPUTTERING; SEMICONDUCTING FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0037212095     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)01975-9     Document Type: Article
Times cited : (24)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.