Dielectric tensor measurement from a single Mueller matrix image

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 24, Issue 3, 2007, Pages 814-824

  Beaudry, Neil A ^a   Zhao, Yanming ^b   Chipman, Russell ^c  

^a Axometrics   (United States)

^b INDIANA UNIVERSITY   (United States)

^c UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT MODULATION; LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT TRANSMISSION; OPTICAL VARIABLES MEASUREMENT;

DIELECTRIC TENSOR MEASURMENT; MUELLER MATRIX IMAGE; OBJECTIVE LENSES;

LENSES;

EID: 34047164531     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.24.000814     Document Type: Article

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