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Volumn 55, Issue 8, 2007, Pages 2747-2756

Dislocation structure evolution and characterization in the compression deformed Mn-Cu alloy

Author keywords

Dislocation; Electron backscatter diffraction; Mn Cu alloy; Stacking fault energy; X ray diffraction

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; MOLECULAR DYNAMICS; POLYCRYSTALS;

EID: 34047134526     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.12.012     Document Type: Article
Times cited : (106)

References (46)
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    • Lehockey E.M., Lin Y., and Lepik O.E. Mapping residual plastic strain in materials using electron backscatter diffraction. In: Schwartz A.J., Kumar M., and Adams B.L. (Eds). Electron backscatter diffraction in materials science (2000), Kluwer Academic/Plenum Publishers, New York (NY) 247
    • (2000) Electron backscatter diffraction in materials science , pp. 247
    • Lehockey, E.M.1    Lin, Y.2    Lepik, O.E.3
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    • (1957) Dislocations and mechanical properties of crystals , pp. 330
    • Friedel, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.