Testing for floating gates defects in CMOS circuits

Proceedings of the Asian Test Symposium

Volumn , Issue , 1998, Pages 228-236

  Rafiq, Sumbal ^a   Ivanov, Andre ^a   Tabatabaei, Sassan ^a   Renovell, M ^a  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

FLOATING GATES DEFECTS;

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; GATES (TRANSISTOR);

INTEGRATED CIRCUIT TESTING;

EID: 0032302090     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)

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