Refinement of conditions of point-contact current imaging atomic force microscopy for molecular-scale conduction measurements

Nanotechnology

Volumn 18, Issue 9, 2007, Pages

  Yajima, Takashi ^a,b   Tanaka, Hirofumi ^a,b,c   Matsumoto, Takuya ^c,d   Otsuka, Yoichi ^d,e   Sugawara, Yoshitaka ^a   Ogawa, Takuji ^a,b,c  

^a INSTITUTE FOR MOLECULAR SCIENCE   (Japan)

^b GRADUATE UNIVERSITY FOR ADVANCED STUDIES   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d OSAKA UNIVERSITY   (Japan)

^e CANON INC   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; HEAT CONDUCTION; POINT CONTACTS; SINGLE-WALLED CARBON NANOTUBES (SWCN);

BUNDLED STRUCTURES; CONDUCTION MEASUREMENTS; POINT CONTACT CURRENT IMAGING ATOMIC FORCE MICROSCOPY (PCIAFM);

ATOMIC FORCE MICROSCOPY;

CARBON NANOTUBE; NANOMATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; ELECTRIC ACTIVITY; MOLECULAR IMAGING; MOLECULAR MECHANICS; NANOANALYSIS; NANOTECHNOLOGY; POINT CONTACT CURRENT IMAGING; PRIORITY JOURNAL;

EID: 33947533135     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/9/095501     Document Type: Article

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