Simultaneous observation of ferroelectric domain patterns by scanning nonlinear dielectric microscope and surface morphology by atomic force microscope

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 6 B, 2000, Pages 3808-3810

  Odagawa, Hiroyuki ^a   Cho, Yasuo ^a   Funakubo, Hiroshi ^b   Nagashima, Kuniharu ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscope; Determination of polarization; Ferroelectric materials; Scanning nonlinear dielectric microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTATIONAL METHODS; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; MAGNESIA; MORPHOLOGY; POLARIZATION; THIN FILMS;

LEAD ZIRCONATE TITANATE; SCANNING NONLINEAR DIELECTRIC MICROSCOPY;

DIELECTRIC FILMS;

EID: 0034205081     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.3808     Document Type: Article

References (6)

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3. Y. Cho, A. Kirihira and T. Saeki: Rev. Sci. Instrum. 67 (1996) 2297.
4. Y. Cho, S. Kazuta and K. Matsuura: Appl. Phys. Lett. 75 (1999) 2833.
5. A. Gruverman, O. Auciello, R. Ramesh and H. Tokumoto: Nanotechnology 8 (1997) A38.
6. Y. Cho, S. Kazuta, K. Ohara and H. Odagawa: to be published in Jpn. J. Appl. Phys.