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Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques

Volumn 96, Issue 5, 2005, Pages 443-447

Imaging grain boundary segregation by electron diffractive imaging

(1) Koch, Christoph T a

a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

Author keywords

Electron diffraction; Interfaces; Segregation

Indexed keywords

ALGORITHMS; ANNEALING; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGING TECHNIQUES; INTERFACES (MATERIALS); SEGREGATION (METALLOGRAPHY); THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC COLUMNS; ATOMIC NUMBERS; ELECTRICAL MICROSCOPES; HIGH-RESOLUTION PHASES;

ELECTRON DIFFRACTION;

EID: 20344392897 PISSN: 00443093 EISSN: None Source Type: Journal
DOI: 10.3139/146.018134 Document Type: Conference Paper

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.