Pattern recognition in high-resolution electron microscopy of complex materials

Microscopy and Microanalysis

Volumn 12, Issue 6, 2006, Pages 476-482

  Niermann, Tore ^a   Thiel, Karsten ^a,b   Seibt, Michael ^a,b  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b Sonderforschungsbereich 602 ^*  (Germany)

Author keywords

Crystal microstructure; Image classification; Interface roughness; Pattern recognition; Transmission electron microscopy

Indexed keywords

EID: 33947496087     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606060685     Document Type: Conference Paper

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