메뉴 건너뛰기




Volumn 879, Issue , 2007, Pages 1539-1544

Nanotechnology and industrial applications of hard X-ray photoemission spectroscopy

Author keywords

Hard X ray photoemission spectroscopy; High resolution; Industrial application; Nanotechnology

Indexed keywords


EID: 33947401777     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2436358     Document Type: Conference Paper
Times cited : (3)

References (20)
  • 3
    • 2942668371 scopus 로고    scopus 로고
    • Y. Takata, K. Tamasaku, T. Tokushima, D. Miwa, S. Shin, T. Ishikawa, M. Yabashi, K. Kobayashi, J. J. Kim, T. Yao, T. Yamamoto, M. Arita, H. Nama.tame, and M. Taniguchi, Appl. Phys. Lett. 84, 4310 (2004).
    • Y. Takata, K. Tamasaku, T. Tokushima, D. Miwa, S. Shin, T. Ishikawa, M. Yabashi, K. Kobayashi, J. J. Kim, T. Yao, T. Yamamoto, M. Arita, H. Nama.tame, and M. Taniguchi, Appl. Phys. Lett. 84, 4310 (2004).
  • 6
    • 33947372280 scopus 로고    scopus 로고
    • Y. Takata et al, invited talk of this conference
    • Y. Takata et al., invited talk of this conference.
  • 7
    • 33947375350 scopus 로고    scopus 로고
    • J. J. Kim, L. Ikenaga, M. Kobata, M. Yabashi, K. Kobayashi, Y. Nishino, D. Miwa, K. Tamasaku, and T. Ishikawa, presented at this conference
    • J. J. Kim, L. Ikenaga, M. Kobata, M. Yabashi, K. Kobayashi, Y. Nishino, D. Miwa, K. Tamasaku, and T. Ishikawa, presented at this conference.
  • 8
    • 33947421843 scopus 로고    scopus 로고
    • International technology roadmap for semiconductorw
    • International technology roadmap for semiconductorw: http://public. itrs.net/.
  • 9
    • 33947430313 scopus 로고    scopus 로고
    • H. Iwai et al., IEDM Tech. Dig. 625 (2002), and reference therein.
    • H. Iwai et al., IEDM Tech. Dig. 625 (2002), and reference therein.
  • 12
    • 32844459019 scopus 로고    scopus 로고
    • The Electrchemical Society. Pennington, NJ
    • H. Nohira et al. ECS Transaction, Vol. 1, No. 1, The Electrchemical Society. Pennington, NJ.(2005), pp. 87-95.
    • (2005) ECS Transaction , vol.1 , Issue.1 , pp. 87-95
    • Nohira, H.1
  • 15
    • 20244385823 scopus 로고    scopus 로고
    • L. Ikenaga et al., J. Llectron Spectrosc. And Relat. Phenom., 144-147, 491 (2005).
    • L. Ikenaga et al., J. Llectron Spectrosc. And Relat. Phenom., 144-147, 491 (2005).
  • 16
    • 33947369224 scopus 로고    scopus 로고
    • K. Torii, K. Shiraishi, S. Miyazaki, K. Yamabe, M. Boero, T. Chikyow, K. Yamada, H. Kitajima, and T. Arikado, Tech. Digest of 2004 IEEE International Electron Device Meeting.
    • K. Torii, K. Shiraishi, S. Miyazaki, K. Yamabe, M. Boero, T. Chikyow, K. Yamada, H. Kitajima, and T. Arikado, Tech. Digest of 2004 IEEE International Electron Device Meeting.
  • 17
    • 33947371851 scopus 로고    scopus 로고
    • Y. Tsuchida, M. Yoshiki, M. Koyama, A. Kinoshita, and J. Koga, IEDM2005 Tech. Dig., 637 (2005).
    • Y. Tsuchida, M. Yoshiki, M. Koyama, A. Kinoshita, and J. Koga, IEDM2005 Tech. Dig., 637 (2005).
  • 18
    • 33947391899 scopus 로고    scopus 로고
    • (Hotel Lquitorial, Shanghai, Chaina)
    • presented at 6th International Workshop on Junction Technology IWJT, May 15-16, to be published
    • C. G. Jin et al., presented at 6th International Workshop on Junction Technology (IWJT), May 15-16, 2006, (Hotel Lquitorial, Shanghai, Chaina), to be published.
    • (2006)
    • Jin, C.G.1
  • 20
    • 33947423092 scopus 로고    scopus 로고
    • T. Nakai, M. Yoshiki, and N. Ohmachi, presented at ODS06, Montreal, Canada, and to be published in SPIE.
    • T. Nakai, M. Yoshiki, and N. Ohmachi, presented at ODS06, Montreal, Canada, and to be published in SPIE.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.