Anomalous electrical transport properties of Ag/Al bilayers grown on Si by molecular beam epitaxy

Solid State Communications

Volumn 142, Issue 4, 2007, Pages 200-205

  Debnath, A K ^a   Joshi, Niraj ^a   Aswal, D K ^a   Deshpande, S K ^b   Gupta, S K ^a   Yakhmi, J V ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

^b DEPARTMENT OF ATOMIC ENERGY   (India)

Author keywords

A. Metallic bilayers; D. Anomalous resistivity; D. Molecular beam epitaxy

Indexed keywords

ALUMINUM ALLOYS; ELECTRIC RESISTANCE; EPITAXIAL LAYERS; MOLECULAR BEAM EPITAXY; SILICON; TRANSPORT PROPERTIES;

METALLIC ALLOYS; TEMPERATURE COEFFICIENT;

SILVER ALLOYS;

EID: 33947246980     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2007.02.016     Document Type: Article

References (23)

1. Murarka S.P. Mater. Sci. Eng. R 19 (1997) 87
2. Wang W., Lanford W.L., and Murarka S.P. Appl. Phys. Lett. 68 (1996) 12
3. Alford T.L., Adams D., Laursen T., and Ullrich B.M. Appl. Phys. Lett. 68 (1996) 23
4. Murarka S.P., Gutmann R.J., Kaloyeros A.E., and Lanford W.A. Thin Solid Films 236 (1993) 257
5. Sharma S.K., and Spitz J. Thin Solid Films 65 (1980) 339
6. Wang Y., and Alford T.L. Appl. Phys. Lett. 74 (1999) 52
7. Alford T.L., Adams D., Laursen T., and Ullrich B.M. Appl. Phys. Lett. 68 (1996) 23
8. Aswal D.K., Muthe K.P., Joshi N., Debnath A.K., Gupta S.K., and Yakhmi J.V. J. Crystal Growth 256 (2003) 201
9. Debnath A.K., Joshi N., Muthe K.P., Vyas J.C., Aswal D.K., Gupta S.K., and Yakhmi J.V. Appl. Surf. Sci. 243 (2005) 220
10. Berzhnoi A.S. Silicon and its Binary Alloys (1966), Consultants Bureau, New York p. 266
11. In: Shröder K. (Ed). CRC Handbook of Electrical Resistivities of Binary Metallic Alloys (1983), Chemical Rubber, Boca Raton, FL 44
12. Joshi N., Debnath A.K., Aswal D.K., Muthe K.P., Senthil Kumar M., Gupta S.K., and Yakhmi J.V. Vacuume 79 (2005) 178
13. Aswal D.K., Joshi N., Debnath A.K., Muthe K.P., Gupta S.K., Yakhmi J.V., and Vuillaume D. J. Appl. Phys. 98 (2005) 026103
14. Toney M.F., Haung T.C., Brennan S., and Rek Z. X-ray depth profiling of thin films. J. Mater. Res. 3 (1988) 351
15. Briggs D., and Seah M.P. Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy (1983), Wiley, New York
16. Van Vechten J.A. Phys. Rev. 10 (1974) 1482
17. Slater J.C. Quantum Theory of Matter (1951), McGraw-Hill, New York (Chapter 10)
18. McCaldin J.O., and Sankur H. Appl. Phys. Lett. 19 (1971) 524
19. Mayer J.W., and Tu K.N. J. Vac. Sci. Technol. 11 (1974) 86
20. Sankur H., and McCaldin J.O. J. Electrochem. Soc. 122 (1975) 565
21. Ziman J.M. The Theory of Electrons and Phonons (1960), Oxford University Press
22. Alford T.L., Gadre K.S., Kim H.C., and Deevi S.C. Appl. Phys. Lett. 83 (2003) 455
23. Tsuei C.C., and Johnson W.L. Phys. Rev. B 9 (1974) 4742