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Volumn 243, Issue 1-4, 2005, Pages 220-227

Surface and electrical-transport studies of Ag/Al bilayer-structures grown by molecular beam epitaxy

Author keywords

AFM; Ag Al bilayer structures; Metal to insulator transition; Molecular beam epitaxy; XPS

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; ELECTRIC INSULATORS; ELECTROMIGRATION; INTEGRATED CIRCUITS; SILVER; THERMAL EFFECTS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 14544286879     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2004.09.066     Document Type: Article
Times cited : (12)

References (19)
  • 14
    • 0004149484 scopus 로고
    • Cambridge University Press Cambridge, UK
    • J.M. Ziman Models of Disorder 1971 Cambridge University Press Cambridge, UK For review, see, e.g.
    • (1971) Models of Disorder
    • Ziman, J.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.