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Volumn 243, Issue 1-4, 2005, Pages 220-227
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Surface and electrical-transport studies of Ag/Al bilayer-structures grown by molecular beam epitaxy
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Author keywords
AFM; Ag Al bilayer structures; Metal to insulator transition; Molecular beam epitaxy; XPS
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
ELECTRIC INSULATORS;
ELECTROMIGRATION;
INTEGRATED CIRCUITS;
SILVER;
THERMAL EFFECTS;
X RAY PHOTOELECTRON SPECTROSCOPY;
BILAYERS;
METAL-TO-INSULATOR TRANSITION;
RESISTIVITY MEASUREMENTS;
SCANNING PROBE MICROSCOPY (SPM);
MOLECULAR BEAM EPITAXY;
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EID: 14544286879
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2004.09.066 Document Type: Article |
Times cited : (12)
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References (19)
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