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Volumn 408, Issue 1-2, 2002, Pages 310-315
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Crystallization kinetics of Ge4Sb1Te5 films
a
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Author keywords
Crystallization; Ge4Sb1Te5; Phase transitions; X Ray reflectometry (XRR)
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Indexed keywords
ACTIVATION ENERGY;
AMORPHOUS MATERIALS;
ANNEALING;
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
ELECTRIC CONDUCTIVITY;
GERMANIUM COMPOUNDS;
HEATING;
PHASE TRANSITIONS;
REACTION KINETICS;
REFLECTOMETERS;
SATURATION (MATERIALS COMPOSITION);
THICKNESS MEASUREMENT;
X RAY ANALYSIS;
X-RAY REFLECTOMETRY (XRR);
THIN FILMS;
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EID: 0037012527
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(02)00062-7 Document Type: Article |
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Times cited : (73)
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References (15)
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