Nanoscale indentation of polymer and composite polymer-silica core-shell submicrometer particles by atomic force microscopy

Langmuir

Volumn 23, Issue 4, 2007, Pages 2007-2014

  Armini, Silvia ^a,b   Vakarelski, Ivan U ^c   Whelan, Caroline M ^a   Maex, Karen ^a,b   Higashitani, Ko ^c  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELEMENTARY PARTICLES; LIGHT SCATTERING; NANOINDENTATION; POLYMETHYL METHACRYLATES; SILICA;

CORE SHELL SUBMICROMETER PARTICLES; LONGITUDINAL DIRECTION; NANOSCALE INDENTATION; SILICA SHELL PARTICLES;

TERPOLYMERS;

NANOMATERIAL; POLYMER; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMISTRY; PH; SCANNING ELECTRON MICROSCOPY; SOLUTION AND SOLUBILITY; ULTRASTRUCTURE;

HYDROGEN-ION CONCENTRATION; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; MODELS, CHEMICAL; NANOSTRUCTURES; POLYMERS; SILICON DIOXIDE; SOLUTIONS;

EID: 33947097481     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la062271e     Document Type: Article

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